IREIS is equipped with numerous means of characterization of surfaces like measures of hundreds of their mechanical, physicochemical, electrical or optical properties but also many topographic analysis and microscopic observation methods.
Characterization of layers / topography / thickness (click here to see more details)
Calotest view with an optical microscope
Roughness meter/profilometer 2D,
Roughness meter/profilometer 3D,
AFM
Profilometer alpha step,
Calotest,
Micrographic cut
Surface energy (drop angle)
White light interferometer
Adherence and roughness characterization (click here to see more details)
Rockwell indentation
Pull test with adhesive tape,
Scratch test,
Indent Rockwell C
Instrumentalised micro-indent
Micro-indent Vickers
Indent Rockwell
Microscopy and analysis (click here to see more details)
Optical microscope
Optical microscopy,
Binocular microscopy
MEB / EDX
Fluorescence X
Optical, electromagnetical and electrical characterization (click here to see more details)
